Site: Russian Academy of Sciences
Institute for Analytical Instrumentation
Rizhsky Prospect, 26
198103, St. Petersburg
Russian Federation

Director: Professor Maxim A. Alexandrov
Dep. Director: Professor Igor A. Vodovatov
Telephone: (812) 251-8600
Fax: (812) 251-7038
E-mail: via@ianin.spb.su

Date Visited: October 28, 1993

Report Author: J. Larimer

ATTENDEES

WTEC:

J. Larimer
E.C. Urban

HOSTS:

George M. Guryanov, Ph.D.
Kirill S. Lutsenko

BACKGROUND

The Institute for Analytical Instrumentation originally was a development and research division of the Science and Technology Corporation of the USSR Academy Sciences (NTO AN SSSR). NTO AN SSSR had three divisions: (1) a design group in St. Petersburg; (2) a manufacturing group located in Chernogolovka (Moscow District), Minsk (Belarus), and Lomonosov (St. Petersburg); and (3) a design group in Moscow. The manufacturing groups are no longer associated with the NTO AN SSSR, which disintegrated in 1991-1992. The design group in St. Petersburg was transformed into a number of small independent firms; the institute is now also independent, and belongs to the Russian Academy of Sciences.

The institute has five departments:

• Department of Spectroscopy and Surface Analysis
  
• Mass Spectrometry Department
  
• Biotechnology Department
  
• Optics Department
  
• Theoretical Department

The WTEC team visited the Department of Spectroscopy and Surface Analysis. The department consists of four laboratories. The team also visited the Laboratory for Scanning Tunneling Microscopy and Spectroscopy. In addition, team members saw a molecular beam epitaxy machine in operation. This machine was designed by the institute and SKB, AP, is manufactured by NTO AN SSSR, and has been offered for sale. No pricing information was given along with the information describing the machine.

The institute has formed an independent enterprise called SPIN, Ltd., intended for designing and manufacturing new original units for molecular beam epitaxy machines, STM devices, and so forth. SPIN can be contacted by writing Kirill S. Lutsenko at:

26, Rizhsky Prospect
St. Petersburg, Russia
(812) 251-4729 (Office)
(812) 251-7038 (Fax)
(812) 108-3242 (Home)
spin@ianin.spb.su (E-mail).

MATERIALS GIVEN OUT DURING THE VISIT

Organizational Description

Department for Spectroscopy and Surface Analysis

George M. Guryanov, Ph.D.
(812) 251-4729, 7377
gur@ianin.spb.su

Kirill S. Lutsenko
(812) 251-4729

a. Laboratory for Microelectronics Technologies

Research fields:

• the development of analytical and computer models for the autoepitaxial and heteroepitaxial growth during molecular beam and migration-enhanced epitaxy, theoretical study of the influences of growth conditions on the characteristics of epitaxial layers and hetero-interfaces
• experimental study of the mechanisms of epitaxial heterolayer formation in the systems of (Al,Ga)As, and the development and experimental study of technological processes for the formation of device structures with quantum dimensional effects
• the development of the known methods and the creation of new methods for in situ diagnostics of thin-film surface
• the development of methods for surface analysis based on electron spectroscopy and microscopy

b. Laboratory of Electron Spectroscopy

Nikolai A. Holin, Ph.D.
(812) 251-6460

Research fields:

• theoretical and experimental researches of the creation of the monofield ESCA-Mass spectrometers based on electrostatic axially symmetrical inhomogeneous fields
• research and design of energy analyzer of Auger-microprobe with high energy and spatial resolution

c. Laboratory for Scanning Tunneling Microscopy and Spectroscopy

Alexander O. Golubok, Ph.D.
(812) 251-2605
golub@ianin.spb.su

Research fields:

• theoretical study of quantum tunneling processes in nanometer structures
• various experimental studies of surfaces, based on tunneling microscopy in different media

  >li> the design and development of different types of scanning tunneling microscopes

• development of STM software

d. Laboratory for Mossbauer Spectroscopy

Sobir M. Irkaev, Ph.D.
(812) 251-9055

Research fields:

• development of the instrument and procedural problems associated with a new method of nuclear gamma resonance (NGR) - multidimensional parametric Mossbauer spectroscopy
• development of theoretical and experimental investigations of a new method for ultra-thin surface layers analysis: grazing incidence Mossbauer spectroscopy (GIMS)

Description of 1203 MBE System

This is a description of a molecular beam epitaxy machine that the Institute manufactures for sale.

Description of Mossbauer Spectrometers

This material consists of sales literature on a range of Mossbauer spectrometers manufactured for sale by the institute. In addition to eight models, there are also a range of options and accessories. No pricing information was included and each machine may be made to order.

REFERENCES

Davydov, D.N., A.O. Golubok, and S.A. Rykov. 1992. "Local Tunneling Spectroscopy of n-PbTe Surface." Ultramicroscopy. 42-44:878-883.

Golubok, A.O., S.A. Vinogradova, S.Y. Tipisev, A.Y. Borisov, A.S. Taisova, and O.V. Kolomytkin. 1992. "STM/STS study of photosynthetic bacterial membrane." Ultramicroscopy. 42-44:1228-1235.

Golubok, A.O., S.A. Masalov, and N.A. Tarasov. 1992. "Thermofield tip formation in UHV/STM combined with field- emission microscope." Ultramicroscopy. 42-44:74- 1579.

Golubok, A.O., and V.A. Timofeev. 1992. "STM combined with SEM without SEM capability limitations." Ultramicroscopy. 42-44:1558-1563.